Single image, single energy - materials classification with any X‑ray imaging detector
- IBEX Multi-Absorption Plate (MAP) technology modulates the X-ray beam in a fine pattern across the detector
- A single exposure collected at a single X-ray kV thus contains energy-dependent information
- This allows materials information to be obtained independent of material thickness even where there is overlapping or no absorption contrast
- Readily integrated into existing flat-panel or line-scanning detectors
Find your way with a MAP
IBEX materials technology is described in more detail in the white paper on our resources page.
Contact us to assess IBEX technology and see how it can add a materials dimension to your X-ray system.