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IBEX Technology

Single image, single energy - materials classification with any X‑ray imaging detector

  • IBEX Multi-Absorption Plate (MAP) technology modulates the X-ray beam in a fine pattern across the detector
  • A single exposure collected at a single X-ray kV thus contains energy-dependent information
  • This allows materials information to be obtained independent of material thickness even where there is overlapping or no absorption contrast
  • Readily integrated into existing flat-panel or line-scanning detectors

 

Find your way with a MAP

IBEX materials technology is described in more detail in the white paper on our resources page.

Contact us to assess IBEX technology and see how it can add a materials dimension to your X-ray system.