Following initial measurements on solid chocolate bars, the sensitivity of the IBEX technology to plastic impurities in chocolate wafer bars was also tested. Such products present a greater challenge to existing X‑ray inspection methods due to natural product variation in the wafer and its position in the chocolate bar.
In this test, thin films of plastic 0.5 mm to 3 mm thick were placed on wrapped samples of chocolate wafers. IBEX-enabled detectors and analysis clearly identified the added plastic down to 0.5 mm thickness, despite a lack of clear absorption contrast. The quantitative measure of contaminant significance opens the way for a pass/fail threshold to be set in a product inspection environment.